Article : A Generalized Software Reliability Growth Model With Different Severity Of Faults

Title

A Generalized Software Reliability Growth Model With Different Severity Of Faults

Author

D N Goswami, Anshu Chaturvedi, Mohammad Altaf Dar

This paper proposes a new software reliability growth model (SRGM) based on the non-homogeneous Poisson process (NHPP) that assumes the presence of three types of faults in the software namely, simple, hard and complex. The faults in the system are considered into three types according to the amount of testing effort needed to remove them. The simple type of fault is modelled by the exponential model of Goel-Okumoto, the hard type of fault is modelled by the delayed S-shaped model of Yamada and the complex type fault is modelled by the three stages of the proposed model. The proposed model is able to fit a variety of reliability growth curves and has been validated on actual software test data sets and its performance has been compared with well-documented SRGMs in the literature.   

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